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EN
Storage reliability is of importance for the products that largely stay in storage in their total life-cycle such as warning systems for harmful radiation detection, and many kinds of defense systems, etc. Usually, the field-testing data can be available, but the failure causes for a series system cannot be always known because of the masked information. In this paper, the storage reliability model with possibly initial failures is studied on the statistical analysis method when the masked data are considered. To optimize the use of the masked survival data from storage systems, a technique based on the least squares (LS) method with an EM-like algorithm, is proposed for the series system. The parametric estimation procedure based on the LS method is developed by applying the algorithm to update the testing data, and then the LS estimation for the initial reliability and failure rate of the components constituting the series system are investigated. In the case of exponentially distributed storage lifetime, a numerical example is provided to illustrate the method and procedure. The results should be useful for accurately evaluating the production reliability, identifying the production quality, and planning a storage environment.
EN
In this paper, we use Markov models for studying the reliability of series systems with redundancy and repair facilities. We suppose that the units’ time to failure and recovery times are exponentially distributed. We consider the cases when 1≤ c ≤ m and m + 1 ≤ c ≤ m + n, for the system of n operating units, m unloaded redundant units and c repair facilities. Using the exponential distributions properties, we obtain stationary reliability indices of the series systems: steady-state probabilities, a stationary availability coefficient, mean time to failure, mean time between failures and mean downtime.
EN
In this paper, we propose a method for studying the reliability of series systems with redundancy and repair facilities. We consider arbitrary distributions of the units’ time to failure and exponentially distributed recovery times. The approach based on the use of fictitious phases and hyperexponential approximations of arbitrary distributions by the method of moments. We consider cases of fictitious hyperexponential distributions with paradoxical and complex parameters. We define conditions for the variation coefficients of the gamma distributions and Weibull distributions, for which the best and same accuracy of calculating the steady-state probabilities is achieved in comparison with the results of simulation modeling.
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