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Ferroelectric composite thin films of x-SBT/PVDF with different SBT content (weight ratios of SBT to PVDF, x = 0 %, 5 %, 10 %, 15 %, 20 %) were prepared by spin-coating method. The crystal structures of x-SBT/PVDF films were analyzed by X-ray diffraction (XRD) measurements and Fourier transform-infrared spectroscopy (FT-IR), respectively. Experimental results demonstrated that both α, β-phases PVDF and the layered perovskite SBT co-existed in the x-SBT/PVDF samples. With an increase of SBT content in the x-SBT/PVDF thin films, both the dielectric constant and the saturated polarization were also increased, compared with those of pure PVDF thin film. More importantly, when the SBT content in the x-SBT/PVDF thin films was larger than 15 %, the coercive field of x-SBT/PVDF thin films was also decreased.
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