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Spectroscopic and diffraction studies of chemical deposition of copper sulfide films on polyamide surface using potassium pentathionate

Krylova V.

Materials Science Poland

2007

Vol. 25, No. 4

933--945

Sulfur sorption-diffusion by polyamide PA 6 film exposed to potassium pentathionate K2S5O6 solutions was investigated by the UV, IR absorption spectroscopy and chemical analysis methods. 2 5 6 S O -?anions were found to sorb into the polymer. The study of sulfur sorption-diffusion kinetics showed that the concentration of sorbed pentathionate ions in polyamide film increased with increasing duration of treatment and the temperature of solution. Sulfur concentration in the polymer was found to depend on the conditions of sorption and varied between 0.94 and 7.64 mg/cm3. The estimated apparent diffusion coefficients of 2 5 6 S O -?ions in polyamide increased with increasing temperature of K2S5O6 solution. On treating sulfured polyamide film with copper(I) salt solution, copper sulfide (CuxS) layers are formed in the surface matrix of the polymer. The content of CuxS depended on the concentration of 2 5 6 S O - ions in the polyamide matrix. Initially dielectric, polyamide films after formation of CuxS layers in their surface matrix become electrical conductors. Samples sulfured in K2S5O6 solution at 293 K for 240 min were the most conductive. X-ray diffraction studies of CuxS layers revealed the presence of two phases: chalcosine and djurleite.