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EN
The hole drift mobility measurements in the quasi - amorphous tetracene films were carried out, and for comparative purposes it was made revision for the hole investigations in the polycrystalline tetracene films. The quasi - amorphous tetracene layers were obtained with aid of vacuum evaporation technique. Tetracene was deposited en the glass substrates with the temperature 170 - 200 K in vacuum of the order of 10-5 Torr. Whereas polycrystalline tetracene layers were obtained with use of the evaporation technique as well. Here, the tetracene was also deposited en the glass substrate( in the room temperature) in the vacuum of the order of 10-5 Torr. The holes mobility was evaluated with the aid of the time - of - flight method. Obtained results suggest that we are with hopping transport throughout localized states near the Fermi level. Furthermore, in the slight manner, the studies demonstrate a little influence of the structure order en the holes mobility value, whereas it was not state the influence of the structure en the transport character for the holes in the tetracene films.
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