This paper is an introduction to the theory of multi-layer models developed for the purpose of qualitative and qauantitative analysis of the piezoelectric photoacoustics spectra of real semiconductor samples. The theory cmprises among others, the new temperature distribution formula necessary for the computations of the piezoelectric characteristics, both frequency, and spectral, and the transformation formula of the energy of photons to the optical absorption coefficients being the function of several optical parameters. In the main part of the paper four multi-layer models of real samples are presented and the characteristic features of the spectra connected with these models are shown and discussed. The following multi-layer model of a heterogeneous sample and a model of enriched layer.
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