Wyniki wyszukiwania - BazTech

Ograniczanie wyników

1 Metrology and Measurement Systems

1 2018

Powiadomienia systemowe

Sesja wygasła!
Sesja wygasła!
Sesja wygasła!

Znaleziono wyników: 1

Liczba wyników na stronie

Wyniki wyszukiwania

Wyszukiwano:
w słowach kluczowych: phase objects

Sortuj według:

Ogranicz wyniki do:

Phase Object Observation System Based on Diffraction Phase Microscopy

Babicz S., Stawarz-Graczyk B., Wierzba P.

Metrology and Measurement Systems

2018

Vol. 25, nr 1

213--221

In the paper authors present a special measurement system for observing phase objects. The diffraction phas microscopy makes it possible to measure the dimensions of a tested object with a nanometre resolution. To meet this requirement, it is proposed to apply a spatial transform. The proposed setup can be based either on a two lenses system (called 4f) or a Wollaston prism. Both solutions with all construction aspects are described in the paper. To make a full analysis of the object shape the authors developed an accurate image processing algorithm, also presented in the paper.