Wyniki wyszukiwania - BazTech

Ograniczanie wyników

1 Optica Applicata

1 2016

Znaleziono wyników: 1

Liczba wyników na stronie

Wyniki wyszukiwania

Wyszukiwano:
w słowach kluczowych: phase measurement profilometry

Sortuj według:

Ogranicz wyniki do:

Method for improving sinusoidal quality of error diffusion binary encoded fringe used in phase measurement profilometry

Tian Z., Chen W., Su X.

Optica Applicata

2016

Vol. 46, nr 2

291--303

Insufficient resolution of digital-light-processing projector will degrade the sinusoidal quality of the binary encoded fringe pattern because of less sampling points in a fringe period, which will degrade the measurement accuracy if it is used in phase measurement profilometry. Two resolutions are proposed in the paper. One is that a cylindrical lens is introduced in the projecting light path of the measurement system to improve sinusoidal quality of the binary encoded fringe by elliptical low-pass filtering of the system. The other one is that superposition of multi-frame binary encoded gratings with different microstructure is to reduce the binary image noise for improving the measurement accuracy. Simulations and experiments verify the validity of the above two methods.