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Analysis of multibackground memory testing techniques

Mrozek I.

International Journal of Applied Mathematics and Computer Science

2010

Vol. 20, no 1

191-205

March tests are widely used in the process of RAM testing. This family of tests is very efficient in the case of simple faults such as stuck-at or transition faults. In the case of a complex fault model-such as pattern sensitive faults-their efficiency is not sufficient. Therefore we have to use other techniques to increase fault coverage for complex faults. Multibackground memory testing is one of such techniques. In this case a selected March test is run many times. Each time it is run with new initial conditions. One of the conditions which we can change is the initial memory background. In this paper we compare the efficiency of multibackground tests based on four different algorithms of background generation.

MPS(3N) transparent memory test for Pattern Sensitive Fault detection

Mrozek I., Busłowska E., Sokół B.

Metody Informatyki Stosowanej

2008

nr 4 (Tom 17)

129--138

Conventional memory tests based on only one run have constant and low faults coverage especially for Pattern Sensitive Faults (PSF). To increase faults coverage the multiple run March test algorithms have been used. As have been shown earlier the key element of multiple run March test algorithms are memory backgrounds. Only in a case of optimal set of backgrounds the high fault coverage can be achieved. For such optimal backgrounds the analytical calculation of NPSFk fault coverage for 3 and 4 runs of MPS(3N) test in this paper is presented. All of the analytical calculations are confirmed and validated by adequate experiments.

Optymalne adresowanie pamięci przy wykorzystaniu usterek uwarunkowanych zawartością (PSF)

Sokół B., Yarmolik S.V.

Pomiary Automatyka Kontrola

2006

R. 52, nr 6 bis

41-43

Celem niniejszej publikacji jest zaprezentowanie nowych algorytmów i technik testowania pamięci bazując na transparentnych testach pamięci. Niniejsza publikacja dotyczy problemu wykrywania usterek pamięci uwarunkowanych zawartością (ang. pattern sensitive faults - PSF). Zawarte w pracy informacje pokazują efektywność użycia testów krokowych przy wykrywaniu pasywnych usterek PSF (passive pattern sensitive faults PPSF). Zbadano efektywność wielokrotnego użycia testów krokowych do wykrywania wyżej wymienionych usterek PPSF oraz przeanalizowano optymalny wybór adresu startowego.

The goal of this paper is to propose new algorithms and techniques for memory testing based on transparent memory tests. This paper deals with memory pattern sensitive faults detection problem. It shows the efficiency of using march tests for detection memory passive pattern sensitive faults. Also it shows the efficiency of multiple runs of march tests for detection PPSF's and analyzes the optimal address seeds.