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2 Borzycki K.

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Temperature dependence of polarization mode dispersion in tight-buffered optical fibers

Borzycki K.

Journal of Telecommunications and Information Technology

2008

nr 1

56-66

Experiments and theoretical analysis of influence of temperature on polarization mode dispersion (PMD) in single mode optical fibers and cables are presented. Forces generated by contracting buffer create optical birefringence and increase fiber PMD at low temperatures. Single mode fiber (SMF) in 0.9 mm polymeric tight-buffer can exhibit an extra component of PMD exceeding 0.3 ps/?km in such conditions. On the other hand, tight-buffered spun nonzero dispersion-shifted fibers (NZDSF) and optical units with stranded single mode fibers have showed good stability of PMD over wide range of temperatures. This is due to presence of circular strain in the core, blocking accumulation of mechanically induced birefringence.

Influence of temperature and aging on polarization mode dispersion of tight-buffered optical fibers and cables

Borzycki K.

Journal of Telecommunications and Information Technology

2005

nr 3

96-104

This paper presents results of laboratory tests investigating influence of temperature on polarization mode dispersion (PMD) in variety of single mode optical fibers and cables. Research was focused primarily on tight-buffered fibers, where most pronounced effects resulting from buffer shrinkage or expansion were expected. The goal was to verify performance of optical fiber cable exposed to extreme temperatures and to compare behavior of different cables. Very strong temperature dependence of PMD was detected in standard single mode fibers with 0.9 mm tight buffer, commonly used in indoor cables, and in complete cable with such fiber. However, both nonzero dispersion-shifted fibers, spun during drawing and optical unit used in optical ground wire (OPGW), where 12 fibers are stranded showed good stability of PMD during thermal cycling. The same optical unit extracted from OPGW exhibited excellent PMD stability also during accelerated life test.