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Charakterystyka wybranych metod badań stabilności układów emulsyjnych

Żbikowska Anna, Sokół Aniela, Szymańska Iwona, Żbikowska Katarzyna, Kowalska Małgorzata, Religa Aleksandra

Przemysł Spożywczy

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2022

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T. 76, nr 9

19--22

PL

Emulsje to układy dyspersyjne powszechnie występujące w przemyśle spożywczym, kosmetycznym i farmaceutycznym. Emulsje są produktami nietrwałymi i dlatego bardzo ważne jest analizowanie ich stabilności przy zmianach technologii produkcji, składu surowcowego oraz opracowywaniu nowych produktów. Omówiono przykładowe metody oceny stabilności układów dyspersyjnych. Krótko przedstawiono tradycyjne badania, skupiając się na analizach obecnie rzadziej stosowanych, a opisanych w literaturze naukowej. W.pracy wskazano duży potencjał urządzeń skanujących niewielkie ilości badanego materiału, dzięki którym możliwa jest charakterystyka rzeczywistego stanu dyspersji oraz długoterminowa analiza zachodzących w emulsjach procesów destabilizacji. Największą wadą takich badań jest wysoki koszt aparatury.

EN

Emulsions are dispersion systems commonly found in the food, cosmetic and pharmaceutical industries. The products are unstable and therefore it is very important to analyze their stability. The aim of the study was to discuss examples of methods of assessing the stability of dispersion systems. Traditional research is outlined briefly, focusing on analyzes that are now less used and described in the scientific literature. The article shows the great potential of scanning devices for small amounts of the tested material. These devices allow to characterize the actual state of dispersion and long-term analysis of destabilization processes taking place in emulsions. The biggest disadvantage of such tests is the high cost of the apparatus.

2

Broadband convolutional scattering characteristics of all dielectric transmission Pancharatnam–Berry geometric phase metasurfaces

Li Yiyun, Jin Yongxing, Jing Xufeng, Shi Lijiang, Li Chenxia, Hong Zhi

Optica Applicata

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2022

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Vol. 52, nr 2

297--323

EN

In order to obtain the broadband scattering characteristics, we propose a superperiodic cell structure with all-dielectric material to construct Pancharatnam–Berry geometric phase encoding metasurfaces. Because we cannot design or prepare infinitesimal coding unit particles, according to the generalized Snell’s law, we can only obtain discrete scattering angle regulation for the basic coding metasurface sequence. In order to obtain multi-angle scattering characteristics, we introduce the Fourier convolution principle in digital signal processing on the Pancharatnam–Berry geometric phase encoding metasurfaces. By using the addition and subtraction operations on two encoding metasurface sequences, a new encoding metasurface sequence can be obtained with different deflection angle. Fourier convolution operations on the encoding metasurfaces can provide an efficient method in optimizing encoding patterns to achieve continuous scattering beams. The addition and subtraction methods are also applicable to the checkerboard coding mode. The combination of Fourier convolution principle and Pancharatnam–Berry phase coded metasurface in digital signal processing can realize more powerful electromagnetic wave manipulation capability.

3

All optical measurement of an unknown wideband microwave frequency

Kumar A., Priye V., Raj Singh R.

Opto-Electronics Review

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2016

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Vol. 24, No. 4

191--195

EN

A novel all optical measurement scheme is proposed to measure wideband microwave frequencies up to 30 GHz. The proposed method is based on a four-wave mixing (FWM) approach in a semiconductor optical amplifier (SOA) of both even order side-bands generated by an unknown microwave frequency modulating an optical carrier. The optical power of a generated FWM signal depends on frequency spacing between extracted side-bands. A mathematical relation is established between FWM power and frequency of an unknown signal. A calibration curve is drawn based on the mathematical relation which predicts the unknown frequency from power withdrawn after FWM.

4

Effect of a weak ion beam treatment of emission layer on the top emission polymer light-emitting diode

Gong T, Gwag J S

Optica Applicata

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2014

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Vol. 44, nr 4

567--574

EN

This study examined the influence of a weakly treated emission layer on ion beam processing for the performance of top emission polymer light-emitting diodes with an invert structure (top ITO as the anode). The emission layer used in this experiment was a polymer type SY, Livilux PDY-132 provided by Merck & Co. The surface of the emission layer was modified by a low energy ion beam treatment to obtain hydrophilic functional groups and improve the wettability. As a hole transfer layer, poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS, CLEVIOS AI 4083, Heraeus) was spin-coated on the ion beam treated emission layer and showed good adhesion properties. Consequently, through such an ion beam treatment that promotes the interface properties of these two layers, a uniform light emitting area was obtained and the light intensity in a top emission polymer light-emitting diode was improved.