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1

Modelowanie struktury potokowej przetworników analogowocyfrowych

Suszyński R.

Przegląd Elektrotechniczny

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2015

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R. 91, nr 9

174-177

PL

W artykule omówiono szybki i wiarygodny sposób weryfikacji projektowanej struktury potokowego przetwornika analogowocyfrowego, z wykorzystaniem reprogramowalnych układów analogowych FPAA AN221E04 do konfiguracji i kolejnych rekonfiguracji opracowywanego układu mieszanego. Dzięki zastosowaniu układów reprogramowalnych wstępny projekt może być wielokrotnie modyfikowany, implementowany w rzeczywistym układzie analogowym i ponownie badany. Pomiary przetwornika pozwalają na ocenę uzyskanych parametrów i iteracyjne poprawienie projektu w celu uzyskania pożądanych właściwości przetwornika.

EN

A modeling and prototyping method for designing pipelined analog-to-digital converter has been presented in the paper. The method is based on implementation of field programmable analog arrays to configure and reconfigure mixed signal systems. A improved pipelined ADC with 1,5 stages has been used as an example. The circuit characteristics have been measured and then structure of the converter has been reconfigured to satisfy input specifications.

2

Diagnostyka układów elektronicznych z magistralą testującą

Borkowska M., Gonera M., Kern J.

Elektronika : konstrukcje, technologie, zastosowania

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2002

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Vol. 43, nr 12

8-11

PL

Omówiono diagnostykę współczesnych układów elektronicznych poprzez wprowadzenie do konstrukcji struktur ułatwionego testowania. Przedstawiono architekturę magistral testujących serii IEEE 1149. Omówiono prace prowadzone w PIE w zakresie własności i aplikacji tej magistrali.

EN

Problems of the diagnostics of the modern electronic circuits and the way to solve them by means of design for testability structures are presented. The architecture of the test buses IEEE 1149 series is shown. Properties of the bus and their applications are the subject of the works in the Industrial Institute of Electronics. The results are presented.

3

Taxonomical built-in fault detector for nonlinear analogue circuits with digital testing bus

Adamczyk A.

Prace Naukowe Instytutu Górnictwa Politechniki Wrocławskiej. Konferencje

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1999

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Vol. 86, nr 24

68-73

EN

The taxonomical method for catastrophic and parametric faults localisation in analogue or mixed-signal circuits for built-in self testers (BIST) is presented. A novel technique for taking of an analogue information from a circuit under test (CUT) makes the basis of the proposed method. This technique allows to relocate the control of the function of electronic circuit from output to input. Binary structure of output signals functions as to steer the reading of the level of input signals. It is quite different from the other methods in which only output signals carry diagnostic information. Testing bus which monitor selected nodal potentials is fully digital, thus presented method is easy to implement in systems designed previously for testing of digital circuits.

4

Measurement and enhancement of multistage sigma-delta modulators

Hejn K., Murphy P., Kale I.

Prace Przemysłowego Instytutu Elektroniki

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1998

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nr 132

18-24

EN

Over-sampled sigma-delta modulators are at present the only solution to realizing high resolution (>16 bits) A/D converters. They are relacively robust against circuit imperfections and well suited for VLSI implementation. Their theoretical basis is well founded in many excellent papers. However, it has to be pointed out that those analyses have not considered effects such as gain mismatch of the stages, timing. Ditters, input noise. Instability of thresholders the asymmetry in the rise fall times of the pulses generated etc. Knowing sigma-delfa modulators theory is not the same as knowing what to do when asked to measure a signal spectrum with 1 dB resolution or -130 dB harmonic distortion. These numerical values are typical for sigma-delta structures with 20-bit potential. This paper specifically addresses such problems suggests some solutions. Simulations known that the key factors are: a coherent measurement event (explicit) digitizing and polyphase recursive all-pass filtering.

5

A VHDL model of an oversampling sigma-delta analogto digital converter

Dąbrowski P., Baraniecki R., Hejn K., Rosiński A.

Prace Przemysłowego Instytutu Elektroniki

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1998

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nr 132

87-92

EN

The IEEE Std. 1076 of VHDL has been primarily devoted to digital circuits' design. However, it can also be applied to certain mixed-signal circuits. An oversampling sigma-delta analog to digital converter has been chosen as a suitable example for behavioral modeling and simulation. The efficiency of the approach is analyzed in the SIGNAL PROCESSING WORKSYSTEM and VANTAGE Spreadsheet environments.