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Sensitivity analysis of electromagnetic quantities by means of FEM

Gawrylczyk K. M.

Journal of Technical Physics

2002

Vol. 43, no 3

323-334

Sensitivity analysis determines the dependence of global or local electromagnetic quantities on geometrical or physical parameters expressed in the form of an objective function. The final aim of the field calculation methods is generally the design of an electromagnetic device. Solution of inverse problem on the basis of the finite elements method (FEM) makes the optimal shape design possible, as well as the identification of material cracks and flaws inside the conducting materials with the help of the eddy-current method. These tasks can be defined similarly for recognition of the spatial distribution of material parameters. The recognition takes place in iterative manner, basing on gradient information derived from the sensitivity analysis. The work deals with sensitivity evaluation in conjunction with finite element algorithms. It will be shown that the sensitivity analysis necessary to solve an inverse problem, requires only a low additional calculation cost.