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Measurement of basic observation parameters of optoelectronic devices in an accredited laboratory. Measurement methodology, uncertainty analysis

Bareła Jarosław, Kastek Mariusz, Firmanty Krzysztof

Measurement Automation Monitoring

2019

Vol. 65, No. 1

2--6

The article describes the methodologies for measuring the basic parameters of optoelectronic observation devices in accordance with applicable standards and international procedures. Noise equivalent temperature difference NETD, minimum resolvable temperature difference MRTD, detection, recognition and identification ranges according to STANAG 4347, angular field of view FOV and modulation transfer function MTF are described. The description and requirements for laboratory measuring stations are presented. The article contains an analysis of measurement uncertainty of measured quantities in accordance with ISO 17025: 2018 and JCGM 100: 2008 guide based on the TOP 6-3-040 procedure.