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Photoreflectance spectroscopy of low-dimensional semiconductor structures

Misiewicz J., Sitarek P., Sęk G.

Opto-Electronics Review

2000

Vol. 8, No. 1

1-24

In this paper, we present the applications of photoreflectance spectroscopy for investigations of low-dimensional, semiconductor structures. We briefly introduce the theoretical background of this technique including the line-shape expressions related to semiconductor microstructures. We show examples of photoreflectance investigations of two-dimensional structures such as quantum wells, multiple quantum wells and superlattices, one-dimensional structures-guantum wires, and quasi zero-dimensional structures-quantum dots. Finally, we concentrate our attention on investigations of the structures of semiconductor devices like high electron mobility transistors, heterojunction bipolar transistors and vertical / planar light emitting lasers structures.