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1
Investigation of semiconductor diode heating based on temperature measurements using a thermovision camera
Litwa M., Wiczyński G.
Poznan University of Technology Academic Journals. Electrical Engineering
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2011
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No. 65
135--141
EN
In the paper, investigations of semiconductor diodę heating to be observed by a rrmovision camera are presented. The presented results are given as time varying waveforms of temperature recorded for the diode case during its heating .
2
Influence of foil shutters on temperature measurements using thermovision camera
Litwa M., Wiczyński G.
Poznan University of Technology Academic Journals. Electrical Engineering
|
2011
|
No. 65
129--134
EN
The influence of the foil shutters on temperature measurements using thermovision cameras was studied. Measurements were carried out in laboratory conditions. The thickess of a polyethylene foil used in experiments was between 0,028 mm to 0,16 mm. Based on the received results of measurements, the scaling coefficient describing a relationship between the indicated and reference temperature was presented.
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