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A suggestion of utilizing bimodal layers of the polymer SU8 for the purpose of monitoring the changes in the refractive index

Gut K.

Optica Applicata

2012

Vol. 42, nr 2

407-416

The paper presents the results of investigations concerning the measurements of the refractive index and the thickness of planar waveguide structures, obtained by photopolymerization of the polymer SU8. In the paper, the mode sensitivity has been calculated as a function of the thickness in a bimodal structure. The differential interference has been analyzed, concerning the modes of the same types TE0-TE1 and TM0-TM1. The thickness of the layer has been determined when the interferometer is most sensitive to the changes in the refractive index.

Differential interference in a polymer waveguide

Gut K.

Bulletin of the Polish Academy of Sciences. Technical Sciences

2011

Vol. 59, nr 4

395-399

The paper presents the results of investigations concerning the measurement of the refractive index and the thickness of planar waveguide structures, obtained by photo polymerization of the polymer SU8. In the paper the mode sensitivity has been calculated as a function of the thickness in a single-mode structure. The thickness of the layer has been determined in the case when the interferometer is most sensitive to changes of the refractive index.