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Measurement system for testing the optical radiation detectors in a broad temperature range

Ćwirko R., Ćwirko J., Bielecki Z.

Metrology and Measurement Systems

2009

Vol. 16, nr 3

491-500

IR, VIS and UV detectors are used in scientific research and industrial or military applications. An integrated system used for spectral characteristic measurements of UV, VIS and IR semiconductor detectors is presented in the paper. The system was developed in the Military University of Technology (MUT). Measurements, including noise measurements, can be carried out in a broad temperature range - from 10 K to 450 K. Selected measurement results for UV detectors are presented in the paper, too.