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EN
Thermoluminescent and semiconductor detectors operating in an integrating mode have been applied to the measurement of X-ray flashes of high intensity from large plasma facilities. A detection head of special kind has been developed to perform comparison measurements with the use of the detectors of both kinds.
EN
A compact, three-channel, noise-resistant detection head based on semiconductor detectors has been built for the diagnostics of X-ray emission from plasmas. It is useful in the energy range of 0.5–20 keV.
EN
Experiments on the influence of high-temperature plasma nanosecond pulse radiation, as generated in plasma focus device, on the W-Cu pseudoalloy, V-35at%Ti alloy, austenitic chromium-manganese 10Cr12Mn20W and 25Cr12Mn20W steels have been carried out. Features of damages, phase-structural transformations and chemical content changes in those materials under such irradiation were investigated.
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