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Automated software-based in-field self-test program synthesis

Jasnetski A., Ubar R., Tsertov A

International Journal of Microelectronics and Computer Science

2017

Vol. 8, nr 2

57--64

This paper presents a methodology to automate functional Software-Based Self-Test program development. We rely on the previously published research on modeling processors using subclass of acyclic directed graphs called High-Level Decision Diagrams (HLDD). The HLDD model of the processor gets generated from its Instruction Set Architecture. The HLDD model is then used together with beforehand prepared assembly program templates in the generation of the complete self-test program. The research presented in this paper includes examples of test generation for the 32-bit SPARCv8 microprocessor Leon 3. The experimental results demonstrate that automatically generated SBST program obtains comparable to the state-of the art fault coverage data.