Wyniki wyszukiwania - BazTech

Ograniczanie wyników

Znaleziono wyników: 2

Liczba wyników na stronie

Wyniki wyszukiwania

Wyszukiwano:
w słowach kluczowych: graded refractive index

Sortuj według:

Ogranicz wyniki do:

Graded SiOxNy layers as antireflection coatings for solar cells application

Lipiński M., Kluska S., Czternastek H., Zięba P.

Materials Science Poland

2006

Vol. 24, No. 4

1009--1016

The results of theoretical optical optimization of the graded index oxynitride antireflection coatings for silicon solar cells are presented. The calculation of reflectance and absorption of layers were carried out using the Bruggeman effective medium approximation with various concentration profiles of SiNx:H in the SiO2 matrices. The experimental optical data of SiNx:H layers deposited by RF (13.56 MHz) plasma enhanced chemical vapour deposition system in various conditions were used for simulation. The highest improvement of the short-circuit current JSC (44.6%) was obtained with an SiOxNy graded layer for SiNx:H with a low refractive index (2.1 at 600 nm) and abrupt concentration profile which is characteristic of a double layer SiO 2-SiNx:H. The graded index profile can be advantageous for SiNx:H with higher indices (n greater than or equal 2.4). Moreover, the enhancement of JSC obtained by application of the antireflection coating is smaller (42.3% for n = 2.4) in this case. The improvement should be higher if the effect of surface passivation is taken into account.

New designs for graded refractive index antireflection coatings

Mahdjoub A., Zighed L.

Engineering Transactions

2005

Vol. 53, iss. 2

185-196

The constant progress in thin layers technology, especially the graded index inhomogeneous dielectrics, allows the realization of antireflection coatings (ARC) that are less sensitive to thickness and to the incidence angle. Graded refractive index silicon oxynitrides are deposited by Electron Cyclotron Resonance Plasma-Enhanced Chemical Vapor Deposition (ECR-PECVD) controlled in-situ by monochromatic ellipsometry. While avoiding the complexity of the classical multilayer ARCs, the obtained AR coatings permit to obtain the same performances, or furthermore to improve the cells efficiency. Different suggested profiles are optimized by simulation, then they are realized and characterized by spectroscopic ellipsometry and reflectance measurement. The photogenerated current can be enhanced by 45%, and weighted reflectance (between 300 and 1100 nm) reduced to 5.6%. The passivating properties of oxinitrides recommend the use of these AR coatings on texturized surfaces. The weighted reflectance would decrease to less than 1% and short-circuit current will thus be enhanced by 52.79%.