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Regulated common-gate TIA with noise improvement for radiation detectors

Dias D. C, Melo F. S, Oliveira L. B., Oliveira J. P.

International Journal of Microelectronics and Computer Science

2014

Vol. 5, nr 2

69--80

A Transimpedance Amplifier (TIA) is a device which performs current-voltage conversion and signal shaping. The most commonly used solution is an Avalanche Photo-Diode (APD) as radiation detector with a feedback TIA. Recently, Silicon Photo-Multipliers (SiPMs), have proven to be good alternatives. The main objective in this paper is to show, evaluate and compare the behavior of a regulated common-gate (RCG) TIA when the light sensitive device is an APD or a SiPM. We will also present two alternative circuits based on the RCG topology. The first can be resumed to the insertion of a transistor, responsible for an improvement in the output noise response of the TIA. This solution proves itself to be a good alternative, since it will improve the Signal-to-Noise Ratio (SNR) of the circuit by around 3 dB, with negligible penalty in consumption (only 2%). The second alternative will be a proposed differential version of the RCG topology, in which the first solution will be included. These two latter solutions will only be tested with a SiPM at the input. We will also study the RCG topology in a RF front-end, providing there is a passive mixer at the TIA’s input. The proposed circuits are simulated with standard CMOS technology (UMC 130 nm), from a 1.2 V supply.

System do pomiarów ostrzowych fotodiod lawinowych TeOFiL 2001

Wójcik J., Zając J., Zaremba G.

Elektronika : konstrukcje, technologie, zastosowania

2002

Vol. 43, nr 12

5-8

Omówiono specyficzne właściwości fotodiod lawinowych, stosowane procedury ich pomiarów i unikalne rozwiązania zastosowane w oprogramowaniu systemu.

Features of the automatic system dedicated to testing semiconductor wafers containing avalanche photodiodes are presented. The paper contains descriptions of specific features of such photodiodes and used test methods. Main features of measurement devices used in the system and unique solutions applied in control software are described.