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1 2009

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Built-in test scheme for detection, classification and evaluation of nonlinearities

Toczek W., Kowalewski M.

Metrology and Measurement Systems

2009

Vol. 16, nr 1

47-59

This paper presents a Built-In Test (BIT) scheme intended for detection of nonlinearities, classification of the form of nonlinearity and evaluation of the total harmonic distortion (THD) of the signal under test, without using expensive automatic test equipment (ATE). The tester is based on a sigma-delta modulator located on a board and artificial neural networks implemented in an attached personal computer. The proposition is verified by simulation in a Matlab/Simulink environment for three classes of nonlinearities - clipping effect, crossover distortion and rate limiting. The model of the Van der Pol oscillator is used as a programmable reference source of nonlinear oscillation.