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Finding of optimal excitation signal for testing of analog electronic circuits

Chruszczyk L., Grzechca D., Rutkowski J.

Bulletin of the Polish Academy of Sciences. Technical Sciences

2007

Vol. 55, nr 3

273-280

This article presents combined approach to analog electronic circuits testing by means of evolutionary methods (genetic algorithms) and using some aspects of information theory utilisation and wavelet transformation. Purpose is to find optimal excitation signal, which maximises probability of fault detection and location. This paper fo-cuses on most difficult case where very few (usually only input and output) nodes of integrated circuit under test are available.