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Algorithm for Longitudinal Profile Diagnostics of the Electron Beam for the FLASH Linear Accelerator in Hamburg

Wychowaniak J

International Journal of Microelectronics and Computer Science

2013

Vol. 4, nr 1

1--5

The lasing process taking place in a free electron laser based on the Self-Amplification Spontaneous Emission (SASE) is generated by high-brightness electron beams passing through an undulator system. There exist strict quality requirements that must be met by the electron bunches constituting the beam in order for the SASE phenomena to appear. This paper describes selected diagnostic installations supervising the longitudinal electron bunch profile parameters for the electron beams in the Free Electron Laser in Hamburg (FLASH) at the Deutsches Elektronen-Synchrotron (DESY) and focuses on software delivered for processing of the acquired diagnostic data.