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A simple method for defect area detection using active thermography

Dudzik S.

Opto-Electronics Review

2009

Vol. 17, No. 4

338-344

In this paper a simple method for defect area detection in the subsurface layer of materials was presented. The method uses active infrared thermography. A statistical detectivity ratio was introduced for a quantitative characterization of areas containing defects. The described algorithm of defect area detection was tested for a material with a low thermal diffusivity. The results of experimental and simulation investigations are presented. It was stated that the statistical detectivity ratio can be used to detect regions of defect presence, even for the non-uniformly heated surfaces.