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Filtered thermal contrast based technique for testing of material by infrared thermography

Gryś S.

Opto-Electronics Review

2011

Vol. 19, No. 2

234-241

A new kind of thermal contrast, called ''filtered contrast'' is presented, which allows detecting and characterizing material defects using active thermography under some assumptions on physical and thermal parameters of materials. In opposition to known definitions of the thermal contrast, knowledge about defect-free area is not necessary and this contrast is less sensitive to nonuniformity of heat disposal to the material surface. The measurements were performed on an experimental setup equipped with a ThermaCAM PM 595 infrared camera and frame grabber. The step heating was chosen as heat excitation. The results demonstrate usefulness of the 1D model of heat transfer used for determination of depth of subsurface defects. The influence of the parameter of the smoothing filter, required for filtered contrast implementation, thermal parameters of the tested material and defect on expanded uncertainty of determination of defect depth is also presented. Due to significant complexity of the model of heat transfer, the conditions for the "law of propagation of uncertainty" were not fulfilled and a numerical method, i.e., Monte Carlo simulation is applied for the propagation of distributions.