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1 2024

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The method for extracting defect levels in the MCT multilayer low-bandgap heterostructures

Majkowycz Kinga, Małgorzata Kopytko, Murawski Krzysztof, Martyniuk Piotr

Opto-Electronics Review

2024

Vol. 32, No. 1

art. no. e149182

A method for defects extraction for a mercury cadmium telluride (MCT) multilayer low-bandgap heterostructure is presented. The N⁺/T/p/T/P⁺/n⁺ epitaxial layer was deposited on a GaAs substrate by a metal-organic chemical vapour deposition (MOCVD). The absorber was optimized for a cut-off wavelength of 𝜆𝑐=6 μm at 230 K. Deep-level transient spectroscopy (DLTS) measurements were conducted for the isolated junctions of the N⁺/T/p/T/P⁺/n⁺ heterostructure. Three localised point defects were extracted within the p-type active layer. Two of them were identified as electron traps and one as a hole trap, respectively.