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Magnetic chip detector (MCD) wear particle analysis

Raadnui S.

International Journal of Applied Mechanics and Engineering

2002

Vol. 7, Spec. is

419-423

In general, Magnetic Chip Detectors (MCD) are used to collect ("catch") ferrous debris for further analysis. The analysts should use microscopic examination of debris morphology characteristics such as shape, size, color, surface texture, thickness ratio, and edge detail as their principal analysis technique. Wear debris is also quantified and trends are plotted to support the visual examination and assist in diagnosis and corrective action. MCD ferrous wear particle analysis is a valuable diagnostic tool for condition monitoring. Samples of MCD are either submitted individually for evaluation of a special problem or over time to establish a baseline for use as a predictive maintenance tool. When trending quantitative debris analysis results over time, machinery component (s) degradation and wear rates can be monitored. Knowing these critical characteristics one can make maintenance decisions and be assured that the right steps will be taken to prevent catastrophic failures of vital machinery.