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EN
We present a method and results of measurements of FPGA (Field Programmable Gate Array) selected timing parameters crucial in many timing sensitive applications such as precise time and frequency metrology. Two main parameters, i.e. the delay and its jitter, were evaluated for look-up-tables (delay 740 ps/jitter 1.33 ps), IO buffers (na/0.45 ps) and carry-chain multiplexers (28ps/0.153 ps) integrated in a programmable device Spartan-6 (Xilinx) which is one of most popular FPGA chips on the market now. Measurements were performed with the use of fast real-time sampling oscilloscope.
EN
The designing process of high resolution time interval measurement systems creates many problems that need to be eliminated. The problems are: the latch error, the nonlinearity conversion, the different duty cycle coefficient of the clock signal, and the clock signal jitter. Factors listed above affect the result of measurement. The FPGA (Field Programmable Gate Array) structure also imposes some restrictions, especially when a tapped delay line is constructed. The article describes the high resolution time-to-digital converter, implemented in a FPGA structure, and the types of errors that appear there. The method of minimization and processing of data to reduce the influence of errors on the measurement is also described.
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