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Modified Bohm’s theory for abstruse measurements: application to layer depth profiling using auger spectroscopy

Rówiński E., Pietruszka M.

Archives of Metallurgy and Materials

2019

Vol. 64, iss. 1

175--180

Modified Bohm’s formalism was applied to solve the problem of abstruse layer depth profiles measured by the Auger electron spectroscopy technique in real physical systems. The desorbed carbon/passive layer on an NiTi substrate and the adsorbed oxygen/surface of an NiTi alloy were studied. It was shown that the abstruse layer profiles can be converted to real layer structures using the modified Bohm’s theory, where the quantum potential is due to the Auger electron effect. It is also pointed out that the stationary probability density predicts the multilayer structures of the abstruse depth profiles that are caused by the carbon desorption and oxygen adsorption processes. The criterion for a kind of break or "cut" between the physical and unphysical multilayer systems was found. We conclude with the statement that the physics can also be characterised by the abstruse measurement and modified Bohm’s formalism.