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EN
An attribute np control chart has been designed using resampling systems for monitoring non- -conforming items under exponentiated half-logistic distribution. We suppose that lifetime follows exponentiated half-logistic distribution. For the proposed control charts, the optimal parameters and control limits have been obtained. The operational formulas for in-control and out of control average run lengths (ARLs) have been derived. Control constants are established by considering the target in-control ARL at a normal process. The extensive ARL tables are reported for various parameters and shifted values of process parameters. The performance of the proposed control chart is evaluated with several existing charts with regard to ARLs, which empower the presented chart and prove far better for timely detection of assignable causes. A wide range of tables, a real-life example, and simulation study for RGS and MDS are given for a better understanding of the problem.
EN
The design of a new mixed attribute control chart adapted to a truncated life test has been pre-sented. It was assumed that the lifetime of a product follows the Weibull distribution and the number of failures was observed using a truncated life test, where the test duration was specified as a fraction of the mean lifespan. The proposed control chart consists of two pairs of control limits based on a binomial distribution and one lower bound. The average run length of the chart was determined for various levels of shift constants and specified parameters. The efficiency of the chart is compared with an existing control chart in terms of the average run length. The application of the proposed chart is discussed with the aid of a simulation study.
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