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A comparison between profile and areal surface roughness parameters

He Baofeng, Ding Siyuan, Shi Zhaoyao

Metrology and Measurement Systems

2021

Vol. 28, nr 3

413--438

Surface roughness has an important influence on the service performance and life of parts. Areal surface roughness has the advantage of accurately and comprehensively characterizing surface microtopography. Understanding the relationship and distinction between profile and areal surface roughness is conducive to deepening the study of areal surface roughness and improving its application. In this paper, the concepts, development, and applications of surface roughness in the profile and the areal are summarized from the aspect of evaluation parameters. The relationships and differences between surface roughness in the profile and the areal are analyzed for each aspect, and future development trends are identified.

Two-step dual-wavelength interferometry for surface relief retrieval

Kmet Arkady B., Muravsky Leonid I., Voronyak Taras I., Stasyshyn Ihor V.

Optica Applicata

2019

Vol. 49, nr 2

331--343

The new two-step dual-wavelength interferometry method that uses only two pairs of interferograms for surface relief retrieval is proposed. In this method, two interferograms in each pair are differed only by an arbitrary phase shift of a reference wave. The method allows using only one out-of-plane shift of a reference wave to record each second interferogram in both pairs, since arbitrary phase shifts between interferograms in each pair can be defined by calculation of the correlation coefficient between two interferograms. This method can extract separately areal surface roughness and areal waviness phase maps from a phase map of the total surface relief and reduce errors produced during the surface relief retrieving. Computer simulation and experimental verification have confirmed the reliability of the proposed method.