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1 2024

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The homotopy perturbation method for electrically actuated microbeams in mems systems subjected to van der waals force and multiwalled carbon nanotubes

Amir Muhammad, Haider Jamil Abbas, Ashraf Asifa

Acta Mechanica et Automatica

2024

Vol. 18, no. 1

123--128

This paper presents a summary of a study that uses the Aboodh transformation and homotopy perturbation approach to analyze the behavior of electrically actuated microbeams in microelectromechanical systems that incorporate multiwalled carbon nanotubes and are subjected to the van der Waals force. All of the equations were transformed into linear form using the HPM approach. Electrically oper-ated microbeams, a popular structure in MEMS, are the subject of this work. Because of their interaction with a nearby surface, these mi-crobeams are sensitive to a variety of forces, such as the van der Waals force and body forces. MWCNTs are also incorporated into the MEMSs in this study because of their special mechanical, thermal, and electrical characteristics. The suggested method uses the HPM to model how electrically activated microbeams behave when MWCNTs and the van der Waals force are present. The nonlinear equations controlling the dynamics of the system can be roughly solved thanks to the HPM. The HPM offers a precise and effective way to analyze the microbeam's reaction to these outside stimuli by converting the nonlinear equations into linear forms. The study's findings shed im-portant light on how electrically activated microbeams behave in MEMSs. A more thorough examination of the system's performance is made possible with the addition of MWCNTs and the van der Waals force. With its ability to approximate solutions and characterize system behavior, the HPM is a potent instrument that improves comprehension of the physics at play and facilitates the design and optimization of MEMS devices. The aforementioned method's accuracy is verified by comparing it with published data that directly aligns with Anjum et al.'s findings. We have faith in this method's accuracy and its current application.