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Characterisation of amorphous state of REE2Fe2+Be2Si2O10 by spectroscopic methods.

Malczewski D., Skrzypek D., Molak A.

Archives of Materials Science

2004

Vol. 25, nr 4

561-571

This paper presents 57Fe Moessbauer spectroscopy, electron paramagnetic resonance (EPR), transmission electron microscopy (TEM), X-ray diffraction (XRD), gamma-ray spectroscopy and dielectric permitivity spectroscopy studies of fully metamict gadolinite REE2Fe2+Be2Si2O10 from Ytterby (Sweden). X-ray and electron diffraction patterns of the sample show complete lack of long range order (LRO). 57Fe Moessbauer spectroscopy of the sample revealed only Fe3+ ions definitely located in octahedral coordinations, similar to thye crystalline structure of gadolinite. The EPR resonance spectrum is complete and its features corespond to Gd3+ and Mn2+ centers. The Gd3+ centers show low-symmetry of local crystal field and may be characterized by distribution of spin-Hamiltonian parameters such as: g-factor and fine-structure parameters. The temperature dependence of utensity proves that a fraction of gadolinium ions interact by superexchange type mechanism and reveals that these exchange interactions are of the antiferromagnetic type Mn2+ centers and the character of Mn2+ EPR spectra indicate that this spectra are atributed to isolated manganium ions. The AC conductivity exhibits thermally activated behavior above 420 K whereas the dielectric constant shows a step-like anomaly near 230 K.

Roughness of amorphous Zn-P thin films

Jarząbek B., Jurusik J., Cisowski J., Nowak M.

Optica Applicata

2001

Vol. 31, nr 1

93-101

The effect of thickness variation and the surface roughness of amorphous Zn/sub 32/P/sub 68/ thin films has been investigated by the interference spectroscopy of the optical transmittance and reflectance, as well as by the atomic force microscopy (AFM). The analysis of the optical data allowed determination of the standard deviation of the thin film thickness by taking into account the Gaussian distribution of the change in phase of radiation traversing a thin film. It appears that the value of the standard deviation of the film thickness determined from the optical interference spectroscopy ( sigma /sub w/ approximately=26 nm) is comparable with the value of the mean surface roughness (R/sub a/ approximately=19 nm) evaluated from the AFM studies.

Influence of magnetic field on the structure of glasses.

Mudry S., Korolyshyn A., Kulyk Y., Halchak V.

Optica Applicata

2000

Vol. 30, nr 4

735-755

The influence of magnetic field on the structure of amorphous alloys has been studied. It is shown that such influence occurs in both the liquid state before glassing and in the amorphous state during thermal treatment. The structural changes investigated by the X-ray diffraction method in liquid Co-B, Co-Cu, Ni-Pb and Mn-Bi eutectic alloys and Ni/sub 0.64/Hf/sub 0.36/ amorphous alloys are considered.