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EN
The article presents the concept of using VNA (Vector Network Analyzer) to measure the temperature of the MOS transistor junction. The method assumes that the scattering parameters of the network consisting of the transistor depend on the temperature. The tests confirmed the influence of temperature on the S11 parameter and the input network capacity during ambient temperature changes in the range of 35-70°C. Measurements were made for the gate-source (G-S) input of the system. The measurements were carried-out with the transistor in the ON/OFF states. In order to validate the measurements, the temperature of the tested element was recorded with the MWIR Cedip-Titanium thermal imaging camera.
PL
W artykule przedstawiono koncepcję wykorzystania wektorowego analizatora sieci VNA (ang. Vector Network Analyzer) do pomiaru temperatury złącza tranzystora MOS. Metoda zakłada, że parametry rozpraszania sieci elektrycznych wewnętrznych struktur tranzystora zależą od temperatury. Badania potwierdziły wpływ temperatury na parametr S11 oraz na pojemność wejściową przy zmianie wartości temperatury otoczenia w zakresie 35-70°C. Pomiary wykonano dla wejścia bramka-źródło (G-S) układu. Pomiary przeprowadzono z tranzystorem w stanach ON/OFF. W celu walidacji pomiarów, temperaturę badanego elementu rejestrowano kamerą termowizyjną MWIR Cedip-Titanium.
EN
Calibration of RF power sensors is crucial issue in RF power measurements. Many calibration laboratories use the direct comparison transfer system with a signal generator and a power splitter. Increasing performance of modern vector network analyzers makes it possible to perform a power sensor calibration with acceptable uncertainties. The main advantage when using a VNA is a simple measurement setup with a wide frequency range (up to 50 GHz, limited only by the VNA and the standard power sensor), where all of required components, i.e. signal generator, a directional coupler and a reference power indicator are built in the VNA technology. This paper reports performing a VNA-based RF power sensors calibration for 10 MHz – 18 GHz band, carried out in the Laboratory of Electric, Electronic and Optoelectronic Metrology at the National Institute of Telecommunications in Warsaw, Poland. In order to validate the proposed solution two of power sensors were calibrated at a reference laboratory. The validation consisted of two steps. At first, one of those characterized power sensors was calibrated at our laboratory in direct comparison transfer system. Finally, the results obtained from the VNA-based system were compared with the previously obtained ones.
EN
This paper described accurate measurement techniques of a 75 ohms antenna with 50 ohms vector network analyzer (VNA). The antenna under test (AUT) was a commercial antenna (SP-073 DTV antenna). The analysis techniques used three basic principles namely the return loss, Friis formula and absolute gain Eq.s to solve the differences of characteristics impedance (Zo). The experimental results showed that although the Zo of AUT was different from the VNA it could also measure the impedance, radiation pattern and gain without the 50 to 75 Ohms converter. While the use of converter led to unacceptable results.
PL
W pracy opisano metodę dokładnego badania anteny 75-ohms przy pomocy analizatora wektorowego sieci VNA. Badania przeprowadzono na przykładzie anteny SP-073-DTV. |Metoda analizy wykorzystuje trzy główne zasady: straty powotnre, formułę Friis i równanie wzmocnienia.
EN
The paper describes some possibilities of the Unshielded Twisted Pair (UTP) cable as an universal signal transmitting line at the range of radiofrequencies from 0,1 to 100 MHz. Four pairs of the UTP in the subject of the impedance of the line with the different load were examined. The Vector Network Analyzer was used as a base measurement equipment [1,2]. Results are clearly shown using charts from the freeware IG-miniVNA computer program. The final experiments conclusion presents the UTP 5e category as a good general purpose transmitting line for universal 100 ohm impedance sources and loads [3].
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