The first surface-enhanced Raman scattering (SERS) spectra were reported in 1974. A few years after discovery SERS became a well established surface analytical technique, which is widely used to study electrochemical and catalytic processes under in situ conditions. Recently one can observe a large increase in the interest in SERS. It is due to two very important developments in the field of SERS spectroscopy, which have been made in the last decade. The first very important achievement is the observation of SERS spectra of single molecules. The second development, having an enormous potential for surface Raman spectroscopy, is the tip-enhanced Raman scattering (TERS): an AFM or STM tip made of the SERS active metal is used to increase the Raman scattering from molecules adsorbed at a surface located underneath the tip. In this approach, a very significant increase in the spatial resolution of SERS measurements is possible. This review is an attempt to provide an overview of the state of the art and further possibilities of these two recently developed SERS techniques.
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