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Synthesis and Characterization of Co-Cs-Nd-Sr-Doped Perovskite-Rutile-Type Structure

Smolinski T., Zhao L., Rogowski M., Wawszczak D., Olczak T., Brykala M.

Archives of Metallurgy and Materials

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2020

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Vol. 65, iss. 4

1417--1423

EN

The perovskite type matrix is considered as solidification material for high-level radioactive waste. In this work the perovskite-rutile-type matrix doped by Co, Cs, Nd and Sr which simulate nuclear waste was prepared by sol-gel route. The material was characterized by several methods such as: X-ray diffraction, energy dispersive X-ray spectrometer, and particle induced X-ray emission combined with Rutherford backscattering spectrometry. The analyzes confirmed chemical composition Co-Cs-Nd-Sr-doped perovskite-rutile-type structure. A virtual model of the pellet`s structure was created non-destructively by Roentgen computed micro-tomography. The leaching tests confirmed high chemical resistance of the matrix.

2

Metal-organic chemical vapour deposition of lithium manganese oxide thin films via single solid source precursor

Oyedotun K. O., Ajenifuja E., Olofinjana B., Taleatu B. A., Omotoso E., Eleruja M. A., Ajayi E. O. B.

Materials Science Poland

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2015

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Vol. 33, No. 4

725--731

EN

Lithium manganese oxide thin films were deposited on sodalime glass substrates by metal organic chemical vapour deposition (MOCVD) technique. The films were prepared by pyrolysis of lithium manganese acetylacetonate precursor at a temperature of 420 degrees C with a flow rate of 2.5 dm3/min for two-hour deposition period. Rutherford backscattering spectroscopy (RBS), UV-Vis spectrophotometry, X-ray diffraction (XRD) spectroscopy, atomic force microscopy (AFM) and van der Pauw four point probe method were used for characterizations of the film samples. RBS studies of the films revealed fair thickness of 1112.311 (1015 atoms/cm2) and effective stoichiometric relationship of Li0.47Mn0.27O0.26. The films exhibited relatively high transmission (50 % T) in the visible and NIR range, with the bandgap energy of 2.55 eV. Broad and diffused X-ray diffraction patterns obtained showed that the film was amorphous in nature, while microstructural studies indicated dense and uniformly distributed layer across the substrate. Resistivity value of 4.9 Omega.cm was obtained for the thin film. Compared with Mn0.2O0.8thin film, a significant lattice absorption edge shift was observed in the Li0.47Mn0.27O0.26film.

3

Pattern formation in centrifugal rapid solidification of Al-Zn alloys

Tashlykova-Bushkevich I., Kozak C., Shepelevich V.

Przegląd Elektrotechniczny

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2010

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R. 86, nr 7

227-229

EN

The microstructure including layer-by-layer elemental composition of rapidly solidified Al-6.0; 9.4; 15.0 Zn (at %) alloys has been examined. Three distinct types of microstructure are found out in a transverse cross-section of the foils. Nonuniform Zn depth distribution shows depletion of thin (0.02 ěm) surface layers by Zn. The zone at contact foil surface has the highest microhardness value. The effect of Zn content on pattern formation in rapid solidification of the alloys with respect to microhardness on foil transverse cross-section was summarized.

PL

Mikrostruktura stopów Al-6.0; 9.4; 15.0 Zn (w%) otrzymanych w procesie szybkiego zestalania została zbadana włącznie z analizą składu pierwiastkowego warstwa po warstwie. W przekroju poprzecznym folii wyróżniono trzy różne typy mikrostruktur. Nierównomierny rozkład głębokościowy Zn wykazuje zubożenie cienkich (0,02.m) warstw powierzchniowych w Zn. Strefa na powierzchni styku folii charakteryzuje się najwyższą wartością mikrotwardości Omówiono wpływ zawartości Zn na powstawanie struktur krystalicznych w procesie szybkiego krzepnięcia tych stopów w odniesieniu do mikrotwardości na przekroju poprzecznym.

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Element depth profiling of implanted samples

Kobzev A.P.

Nukleonika

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1999

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Vol. 44, nr 2

309-316

EN

Nuclear techniques, namely Rutherford Back Scattering (RBS) and Elastic Recoil Detection (ERD) have been used in the analysis of the implanted samples. The sensitivity of the RBS method depends on the atomic number of the implanted elements as Z[indeks górny]2. Thus, there is a possibility of measuring very low concentrations of heavy ions implanted in a light matrix. The depth profile of oxygen was obtained using elastic resonance in the nuclear reaction 16O(4He, 4He)16O at 3.045 MeV of 4He ions. The ERD technique was applied to obtain the depth profile of hydrogen. Some problems concerning the roughness of the implanted samples are discussed as well.

PL

Do badań implantowanych próbek użyto metod jądrowych opartych na efekcie rozpraszania wstecznego Rutherforda (RBS) i elastycznego odrzutu (ERD). Czułość metody RBS zmienia się wraz z liczbą atomową Z implantowanego pierwiastka, jak Z[indeks górny]2, co daje możliwość pomiaru nawet bardzo niewielkiej koncentracji ciężkich, implantowanych do lekkich tarcz, jonów. W przypadku głębokościowych rozkładów koncentracji tlenu do badań zastosowano rezonansową reakcję jądrową 16O(4He, 4He)16O dla jonów 4He o energii 3.045 MeV. Natomiast technikę ERD zastosowano w badaniach głębokościowych profili wodoru. W pracy omówione są także pewne problemy związane z chropowatością warstw implanowanych próbek.