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Two-way ANOVA gage R&R working example applied to speckle intensity statistics due to different random vertical surface roughness characteristics using the Fresnel diffraction integral

Cywiak Moisés, Cywiak David, Yáñez Etna

Metrology and Measurement Systems

2020

Vol. 27, nr 1

103--117

We present computer simulations of a two-way ANOVA gage R&R study to determine the effects on the average speckle width of intensity patterns caused by scattered light reflected from random rough surfaces with different statistical characteristics. We illustrate how to obtain reliable computer data that properly simulate experimental measurements by means of the Fresnel diffraction integral, which represents an accurate analytical model for calculating the propagation of spatially-limited coherent beams that have been phase-modulated after being reflected by the vertical profiles of the generated surfaces. For our description we use four differently generated vertical profiles and five different vertical randomly generated roughness values.