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EN
The general properties of the deformation substructure are by now well-documented in the literature, but some of the more detailed properties still remain to be studied. In the present work we examine more closely the structures known as Frank dipoles or faulted dipoles, which are recognized in electron micrographs as faint lines terminating within the crystal and running in two <110> directions in the primary glide plane but not in the primary glide direction. The presence of faulted dipoles in formed materials was reported in some of the early transmission electron microscope (TEM) investigations of the 1960s and 1970s e.g., Cu single crystals [1,2], Ni-Co single crystals [3], Ag [4], Cu-2%Al single crystals [5], and in Ge [6]. In these studies, faulted dipoles were detected only in lightly deformed material in regions of the crystal relatively free of other dislocations. The present work takes advantage of the improved resolution available with today's electron microscopic techniques to examine the occurence of faulted dipoles in copper and copper alloy single crystals deformed to various stages in tension.
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