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Methods for economical test of dynamic parameters ADCs

Vedral J., Fexa P., Svatoš J.

Metrology and Measurement Systems

2009

Vol. 16, nr 1

161-170

This paper describes two methods for economical test of dynamic parameters ADCs. First method is Exponential Fit Test, second method is Wobbler Test. Common testing methods are mentioned as far the accuracy and time necessary for the complete test are concerned. The tests for fast evaluation of the dependence of an effective number of bits on frequency of input signal are described and the comparison of proposed method with the standard methods is given. The suitable area of proposed method application is "each-piece" factory testing requiring extremely short time testing.