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1 Elektronika : konstrukcje, technologie, zastosowania

1 2001

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Wyznaczanie średniej nieelastycznej drogi swobodnej elektronów w wybranych stopach binarnych za pomocą elektronowej spektroskopii piku elastycznego (EPES)

Krawczyk M., Sobczak J. W., Jabłoński A.

Elektronika : konstrukcje, technologie, zastosowania

2001

Vol. 42, nr 8-9

66-67

While inelastic mean free paths of electrons (IMFPs) for different energies can be calculated for alloys from predictive formulae, IMFPs can be experimentally measured by the elastic peak electron spectroscopy (EPES). In this method, experimentally determined ratios of elastically backscattered electrons from test surfaces and from a reference material are compared with the values evaluated from Monte Carlo calculations. The paper is dealing with the experimental determination of the IMFP in selected binary alloys, i.e. AuxCu100-x (x = 25, 50, 75 at.%) and AuxPd100-x (x= 10, 50, 90 at.%) within the 200-2000 eV range. The data were recorded using the DCMA-PHI15-255G spectrometer. Surface composition of the alloy samples was investigated prior to and after the EPES measurements by x-ray photoelectron spectroscopy (XPS) using an ESCALAB 210 spectrometer. The relative EPES measurements were performed with use of an Au standard. The measured IMFPs were compared with IMFPs calculated from the TPP-2M predictive formula of Tanuma et al. The scatter between the measured IMFPs and calculated from the predictive formula has been statistically analysed.