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Efficient procedure for freeform surface accuracy assessment

Poniatowska Małgorzata

Metrology and Measurement Systems

2025

Vol. 32, nr 1

1--12

The document provides a procedure for accuracy assessment of freeform surfaces based on CMM sampling limited to critical areas, i.e. areas of distribution of the highest deviations predicted from a theoretical or experimental CAD model of deviations. The value of the form deviation is determined by the point furthest away from the nominal CAD model, i.e. the critical point. Critical areas on the deviation model are determined taking into account the uncertainty of predicting a high of an actual surface profile at a critical point. All steps of the procedure are performed in the CAD environment. The proposed procedure is more efficient than the traditional method of distributing points over the entire surface with the same measurement uncertainty. The procedure is demonstrated by assessing the accuracy of a component after three-axis milling, using a theoretical model of the deviations.