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Arrhenius Accelerated Life Test for Luminary Life of High Bright Light Emitting Diodes

Edirisinghe M., Rathnayake P.

International Letters of Chemistry, Physics and Astronomy

2015

Vol. 49

48--59

The High Bright Light Emitting Diodes (HBLEDs) generally having long life but very often its actual life is different from vendor’s specification. Vendors do not specify the failure criteria for their products but it may vary from 50% to 70% light output maintenance. Further time to test such a quantity takes too long under normal conditions. Longer time consumption for evaluation of such a quantity may not useful in mass production process of HBLEDs. The present study describes the determination of the useful lifetime of 1-W HBLEDs using Arrhenius Accelerated Life Test Model with the modeling parameter as the junction temperature. Failure criterion was chosen as 70% light output maintenance while two stress levels were selected as 90 °C and 110 °C and as recommended by IES LM-80-08 standard. Furthermore, forward voltage of the HBLED was used to determine junction temperature of the diode which is a critical parameter for this study. Moreover, junction temperature of the HBLED recognized as the most critical factor for degrades the lifespan. The Arrhenius Model is based on the junction temperature and activation energy parameters. The activation energy and the scaling factor were found to be 1.31 eV and 6.86×10-17 hours respectively. HBLED junction temperature under room temperature (23 °C) was found to be 55.72 °C. Finally the 70% luminary life time of 1-W HBLEDs under these conditions was found to be 8,344 hours.

Study of an adaptive accelerated model and a data transfer method based on a Reliability Enhancement Test

Tao J., Yu Z., Ren Z., Yi X.

Eksploatacja i Niezawodność

2014

Vol. 16, no. 1

128--132

Aby ocenić niezawodność produktu za pomocą testu poprawy niezawodności (Reliability Enhancement Test, RET), w badaniach najpierw rozważano proces zmiany parametrów modelu Arrheniusa poprzez połączenie modelu Arrheniusa z modelem Duane'a oraz przedstawiono adaptacyjny model przyspieszony i metodę oceny parametrów. Następnie, na podstawie adaptacyjnego modelu przyspieszonego opisano metodę transferu danych z RET do badań przy normalnym oddziaływaniu czynników zewnętrznych. Wreszcie, omówiono różnice obserwowane przy zastosowaniu RET do badań identyfikacyjnych niezawodności i badań wzrostu niezawodności. Na przykładzie zagadnienia inżynierskiego przedstawiono także metodę obliczania wskaźnika niezawodności produktu za pomocą RET.

To assess the reliability of a product using a Reliability Enhancement Test (RET), this study first considers the change process of the Arrhenius model parameters by combining the Arrhenius model with the Duane model and gives an adaptive accelerated model and a parameter estimation method. Then, the data transfer method from the RET to normal test stress are described based on the adaptive accelerated model. Finally, the differences observed when the RET is used for a reliability identity test or a reliability growth test are discussed, and an engineering case demonstrates a method for obtaining the reliability index of a product using the RET.