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Influence of quantum dots shape approximation on size reconstructed from atomic force microscopy measurements

Piotrowski T., Sikorski S.

Opto-Electronics Review

2009

Vol. 17, No. 3

252-254

In this work we discuss the influence of the atomic force microscopy (AFM) probe tip geometry and the object - quantum dot form on the quantum dots dimension in the growth plane reconstructed from the AFM measurements. It is shown that ignoring the geometry of the probe tip and the quantum dot leads to significant differences between dimensions obtained from the AFM measurements and the real dimensions. Inaccuracies in QD size determination of the nano-objects from AFM measurements are defined.