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Modification of the rotating crystal method for examining MBE structures, such as PbTe layers formed on BaF2 substrate

Przedpełski W., Ziencik H.

Journal of Technical Physics

1999

Vol. 40, no 2

175-179

A modification of the rotating crystal X-ray diffraction method was used for examining the structure of thin layers, such as e.g., PbTe layers produced by MBE. These examinations were used for comparing the structures of real and ideal crystals.