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Defect solitons supported by kagome photonic lattices in biased photovoltaic-photorefractive crystals

Hui J., Lu K., Zhao C., Gao L., Chen W.

Optica Applicata

2018

Vol. 48, nr 3

349--359

We report that defect solitons can be supported by kagome photonic lattices with a defect in biased photovoltaic-photorefractive crystals. For a positive defect, these defect solitons exist only in the semi-infinite bandgap and are stable in the low power region but unstable in the high power region. For a negative defect, these defect solitons exist in both of the semi-infinite bandgaps and the first bandgap. In the semi-infinite bandgap, low-power defect solitons are stable when the negative defect depth is low and unstable when the negative defect depth is high, moderate-power defect solitons are stable when the negative defect depth is high, and high-power defect solitons are unstable for all the negative defect depths. In the first bandgap, defect solitons are stable in all the power regions when the negative defect depth is low. When the negative defect depth is high, defect solitons are stable in the high power region and unstable in the low power region. On the other hand, these defect solitons are those studied previously in kagome photonic lattices with a defect in biased non-photovoltaic-photorefractive crystals when the bulk photovoltaic effect is negligible and those in kagome photonic lattices with a defect in photovoltaic-photorefractive crystals when the external bias field is absent.

Design of Stable Semantic Measurement for Ontology-Based Systems

Ma Y., Shang Y., Lu K.

Przegląd Elektrotechniczny

2013

R. 89, nr 3a

115--120

Ontology selection is an important challenge in the field of ontology engineering. A feasible solution of ontology selection is to measure and evaluate the candidate ontologies, and further select and reuse the high-quality ontologies from them according to some measurement criteria. In this paper, we designed an ontology measurement system (ONTOM) for measuring the quality of candidate ontologies by integrating our semantic ontology metrics into ONTOM. The experiments show that ONTOM can effective measure the semantic quality of ontologies for ontology reuse.

W artykule przedstawiono system pomiaru ontologii ONTOM, realizujący dwie główne funkcje: pomiar semantyk ontologii oraz określenie parametru jakościowego ontologii. W pierwszym punkcie dokonany jest dobór czynników, które należy uwzględnić w pomiarze. W drugim kroku działań chodzi o określenie parametru odzwierciedlającego ontologię danego kandydata. Przedstawiono wyniki badań eksperymentalnych.