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EN
An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ = 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterization.
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EN
Nanostructured targets, based on hydrogenated polymers with embedded nanostructures, were prepared as thin micrometric foils for high-intensity laser irradiation in TNSA regime to produce high-ion acceleration. Experiments were performed at the PALS facility, in Prague, by using 1315 nm wavelength, 300 ps pulse duration and an intensity of 1016 W/cm2 and at the IPPLM, in Warsaw, by using 800 nm wavelength, 40 fs pulse duration, and an intensity of 1019 W/cm2. Forward plasma diagnostic mainly uses SiC detectors and ion collectors in time of fl ight (TOF) confi guration. At these intensities, ions can be accelerated at energies above 1 MeV per nucleon. In presence of Au nanoparticles, and/or under particular irradiation conditions, effects of resonant absorption can induce ion acceleration enhancement up to values of the order of 4 MeV per nucleon.
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