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Appointing of surface topography parameters to describe the diffuse reflective properties of selected dielectrics

Majchrowski R., Rozanski L., Grochalski K.

Measurement Automation Monitoring

2017

Vol. 63, No. 3

78--81

The investigations have been performed in order to choose the specific roughness parameters, which would inform the customer about the diffuse emissive and reflective characteristics of the adhesive tapes used in the thermographic measurements. To achieve that, a series of the surface topography parameters of various adhesive tapes (i.e. objects with diffusive reflective characteristics) and various glass plates (i.e. objects with directional reflective characteristics) has been examined. For the analysis of surface topography the following parameters were selected: Sdr (the Developed Interfacial Area Ratio) and Sdq (the Root Mean Square Surface Slope). These selected parameters seem to be most suitable to describe the properties of the surface in the discussed aspect.

The Design Concept of the Laboratory Heater for Studying the Effect of Surface Topography to Emissivity

Majchrowski R., Grochalski K., Rozanski L.

Measurement Automation Monitoring

2015

Vol. 61, No. 6

176--179

Remote temperature sensing and thermal imaging systems [1, 2] are invaluable tools in various fields of science and technology. The fact that radiation is a function of object surface temperature makes it possible for remote temperature measurement systems to calculate this temperature. However, to measure temperature accurately with IR system, it is necessary to know emissivity. Emissivity is one of the major sources of error in radiometric measurements. Generally, emissivity is not constant as it depends on several parameters: temperature, viewing angle, wavelength, contamination or roughness. The article presents a laboratory heater which can be used to measure the thermal emissivity ε depending on the sample surface topography.