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Quasistationary current contributions in electronic devices

Neyts K., Beeckman J., Beunis F.

Opto-Electronics Review

2007

Vol. 15, No. 1

41-46

In an electronic device, the current supplied to the electrodes is related to different types of processes inside the device: current density, change in spontaneous polarization, and change in dielectric properties. Two expressions for the electrode current are derived: one is based on the time derivative of the Shockley-Ramo theorem, the other on the time derivative of the dielectric tensor. This result is illustrated for a switching liquid crystal device and a two-dimensional flux tube.

Monte Carlo algorithm for drift and diffusion of ions in anisotropic, non-homogeneous media

Stojmenovik G., Vermael S., Beunis F., Neyts K., Verschueren A. R. M.

Opto-Electronics Review

2007

Vol. 15, No. 1

13-19

A new Monte Carlo algorithm for ion transport in two-dimensional anisotropic media is reported. It is based on physical considerations of drift and diffusion in anisotropic media with or without an impermeable boundary. Inhomogeneities in the medium and electric field can be taken into account by averaging along the ion trajectory. The algorithm has been appplied to the calculation of ion transport in liquid crystal displays and has been successfully compared with a finite difference program on a one-dimensional liquid crystal structure.

Observation of out-coupling of a nematicon

Beeckman J., Neyts K., Hutsebaut X., Haelterman M.

Opto-Electronics Review

2006

Vol. 14, No. 4

263-267

In this work we present the observation of spatial optical solitons in liquid crystal cells by recording the diffraction pattern of the out-coupled beam on a distant screen. Simultaneously, the light propagation is observed via scattering measurements. The most important observation is displacement of the beam on the screen due to the transverse undulation inside the cell. This undulation is caused by the anisotropic walk-off of the beam. The displacement is in good agreement with the values of the undulation earlier reported.