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Tunable axial resolution in confocal scanning microscopy by controlled symmetrical defocusing.

Martinez-Corral M, Kowalczyk M., Kowalczyk M., Andres P.

Optica Applicata

1998

Vol. 28, nr 3

213-225

There is presented a quite simple technique for improving the axial resolution capacity of confocal scanning microscopes without detriment to their transverse resolution. The technique, that is based in the equal contribution to the image of the illuminating and collecting lenses, consists in symmetrical defocusing of both parts of the imaging system.